A 610-day aging test of a scientific CMOS X-ray detector shows no significant degradation in key performance parameters, with a projected gain loss of 2.4% over ten years.
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Long-term stability of scientific X-ray CMOS detectors
A 610-day aging test of a scientific CMOS X-ray detector shows no significant degradation in key performance parameters, with a projected gain loss of 2.4% over ten years.