Silica thin films show 6% out-of-plane elastic anisotropy removable by 900°C annealing, measured via Brillouin scattering and confirmed by IR reflectivity, with implications for thermal noise models.
With axis x3 per- pendicular to the film surface, and axes x1 and x2 in plane, these constants are c11, c33, c44, c66, c13
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Elastic and structural anisotropy in silica thin films for gravitational-wave detectors
Silica thin films show 6% out-of-plane elastic anisotropy removable by 900°C annealing, measured via Brillouin scattering and confirmed by IR reflectivity, with implications for thermal noise models.