A BdG simulation study finds that vacancies in the aluminum layer and barrier thickness variations can explain the observed critical-current scatter in Nb/Al-AlOx/Nb junctions, while pinholes would cause much larger currents and are more likely associated with device failures.
Gurvitch , author M
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
fields
cond-mat.supr-con 1years
2019 1verdicts
CONDITIONAL 1representative citing papers
citing papers explorer
-
Disorder and Critical Current Variability in Josephson Junctions
A BdG simulation study finds that vacancies in the aluminum layer and barrier thickness variations can explain the observed critical-current scatter in Nb/Al-AlOx/Nb junctions, while pinholes would cause much larger currents and are more likely associated with device failures.