Experimental comparison of ferromagnetic Josephson junctions finds consistent parameters between I-V modeling and escape dynamics, with submicron Al devices exhibiting quantum phase diffusion.
Characterization of scal- able Josephson memory element containing a strong ferromagnet.Journal of Applied Physics, 127(19):193901, 05 2020
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
fields
cond-mat.supr-con 1years
2026 1verdicts
UNVERDICTED 1representative citing papers
citing papers explorer
-
Phase dynamics and dissipation in tunnel ferromagnetic Josephson junctions
Experimental comparison of ferromagnetic Josephson junctions finds consistent parameters between I-V modeling and escape dynamics, with submicron Al devices exhibiting quantum phase diffusion.