A single orientable Timepix3 detector enables EBSD, RKD, TKD in multiple geometries plus BSE/ECCI/STEM-in-SEM imaging in one SEM for bulk and thin-foil samples.
Crimp, Scanning electron microscopy imaging of dislocations in bulk materials, using elec- tron channeling contrast, Microscopy Res & Techniqu e 69 (2006) 374 –381
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A single multi-configuration Direct Electron Detector for various electron imaging and diffraction-based techniques in SEM
A single orientable Timepix3 detector enables EBSD, RKD, TKD in multiple geometries plus BSE/ECCI/STEM-in-SEM imaging in one SEM for bulk and thin-foil samples.