An open-circuit, time-resolved conductive AFM method separates triboelectric and piezotronic currents and measures the direct axial piezoelectric coefficient of single GaAs nanowires (0.4-1 pm/V).
Wang, et al., Piezoelectric field effect transistor and nanoforce sensor based on a single ZnO nanowire, Nano letters 6, 2768 (2006)
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Time-Resolved Open-Circuit Conductive Atomic Force Microscopy for Quantitative Analysis of Nanowire Piezoelectricity and Triboelectricity
An open-circuit, time-resolved conductive AFM method separates triboelectric and piezotronic currents and measures the direct axial piezoelectric coefficient of single GaAs nanowires (0.4-1 pm/V).