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BECKER, Journal of Microscopy 247, 119 (2012), https://onlinelibrary.wiley.com/doi/pdf/10.1111/j.1365-2818.2012.03618.x

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High resolution large working distance scanning helium microscopy

physics.optics · 2026-05-19 · accept · novelty 5.0

Sub-micron resolution (340 nm beamwidth) achieved in large-working-distance pinhole scanning helium microscopy through constrained optimization of atom optics, redesigned pinhole plate, smaller pinhole, increased source distance, and larger detector aperture.

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