A modular automated probe card system enables flexible I-V and C-V characterization of 16x16 LGAD arrays with low added leakage and scan times of 20-340 minutes.
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Development of a system for testing full-size CMS LGAD sensors
A modular automated probe card system enables flexible I-V and C-V characterization of 16x16 LGAD arrays with low added leakage and scan times of 20-340 minutes.