A universal set of phase-error-transparent gates is constructed for high-spin cat codes in donor-in-silicon processors, with simulations showing they outperform non-transparent gates and can cross break-even.
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Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes
A universal set of phase-error-transparent gates is constructed for high-spin cat codes in donor-in-silicon processors, with simulations showing they outperform non-transparent gates and can cross break-even.