Tantalum resonators on silicon with a niobium seed layer reach internal quality factors up to 3.6 million at high power and kinetic inductance up to 0.6 pH per square, with thinner films giving more inductance but lower quality.
High-quality superconducting {\alpha}-Ta film sputtered on heated silicon substrate
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abstract
Intrigued by the discovery of the long lifetime in the {\alpha}-Ta/Al2O3-based Transmon qubit, researchers recently found {\alpha}-Ta film is a promising platform for fabricating multi-qubits with long coherence time. To meet the requirements for integrating superconducting quantum circuits, the ideal method is to grow {\alpha}-Ta film on a silicon substrate compatible with industrial manufacturing. Here we report the {\alpha}-Ta film sputter-grown on Si (100) with a low-loss superconducting TiNx buffer layer. The {\alpha}-Ta film with a large growth temperature window has a good crystalline character. The superconducting critical transition temperature (Tc) and residual resistivity ratio (RRR) in the {\alpha}-Ta film grown at 500 {\deg}C are higher than that in the {\alpha}-Ta film grown at room temperature (RT). These results provide crucial experimental clues toward understanding the connection between the superconductivity and the materials' properties in the {\alpha}-Ta film and open a new route for producing a high-quality {\alpha}-Ta film on silicon substrate for future industrial superconducting quantum computers.
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Engineering high-Q superconducting tantalum microwave coplanar waveguide resonators for compact coherent quantum circuits
Tantalum resonators on silicon with a niobium seed layer reach internal quality factors up to 3.6 million at high power and kinetic inductance up to 0.6 pH per square, with thinner films giving more inductance but lower quality.