A PINN framework solves 2D plane-wave scattering for both TM and TE polarizations, with a tanh-smoothed permittivity used to recover TE accuracy at dielectric boundaries.
Bi-directional ray tracing enhanced automatic forward parametric scattering model for complex coated struc- ture,
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Physics-Informed Neural Networks for 2D Plane Wave Scattering in Arbitrary Dielectric Structures
A PINN framework solves 2D plane-wave scattering for both TM and TE polarizations, with a tanh-smoothed permittivity used to recover TE accuracy at dielectric boundaries.