Bifocusing indicator function for bistatic imaging of small dielectric targets has resolution that degrades with increasing bistatic angle and becomes unusable at exactly 180 degrees, as shown by Bessel series analysis and Fresnel dataset simulations.
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Mathematical and experimental validation of the bifocusing method tailored for bistatic measurement
Bifocusing indicator function for bistatic imaging of small dielectric targets has resolution that degrades with increasing bistatic angle and becomes unusable at exactly 180 degrees, as shown by Bessel series analysis and Fresnel dataset simulations.