A computer-vision pipeline for room-temperature optical screening of MKID detector wafers reports 98.6% simulated defect-detection accuracy, yet its predicted yields on two real chips were far from cryogenic measurements.
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Automated analysis of the visual properties of superconducting detectors
A computer-vision pipeline for room-temperature optical screening of MKID detector wafers reports 98.6% simulated defect-detection accuracy, yet its predicted yields on two real chips were far from cryogenic measurements.