A probabilistic circuit's internal node likelihoods define a pseudo-metric (HLD) whose mean and covariance can be computed exactly from the circuit, enabling a batch-level out-of-distribution test with an analytic threshold.
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A Probabilistic Circuit-Induced Pseudo-Metric for Out-of-Distribution Detection
A probabilistic circuit's internal node likelihoods define a pseudo-metric (HLD) whose mean and covariance can be computed exactly from the circuit, enabling a batch-level out-of-distribution test with an analytic threshold.