By fitting simulated muon stopping profiles to measured muonic X-ray depth profiles, the authors recover gold layer thicknesses of 3.5 to 11 micrometers on gilded copper alloys, matching scanning electron microscopy for most samples.
Time-of-flight secondary ion mass spectrometry imaging in cultural heritage: A focus on old paintings,
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Depth profiling the elemental composition with negative muons: Monte Carlo based tools for improved data analysis
By fitting simulated muon stopping profiles to measured muonic X-ray depth profiles, the authors recover gold layer thicknesses of 3.5 to 11 micrometers on gilded copper alloys, matching scanning electron microscopy for most samples.