Subgap defect density-of-state spectra of SnO and Cu2O p-type thin-film transistors resolve metal-vacancy and oxygen-related defect peaks that control p-type operation.
While the tin and oxygen vacancy peaks are expected, peaks 1 and 5 require more discussion
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Defect density of states of tin oxide and copper oxide p-type thin-film transistors
Subgap defect density-of-state spectra of SnO and Cu2O p-type thin-film transistors resolve metal-vacancy and oxygen-related defect peaks that control p-type operation.