(29) Defects in Two-Dimensional Materials, 1st ed.; Addou, R., Colombo, L.

https://doi · npj 2D Materials and Applications · DOI 10.1038/s41699-024-00492-7

1 Pith paper cite this work, alongside 30 external citations. Polarity classification is still indexing.

1 Pith paper citing it

30 external citations · OpenAlex

open at publisher browse 1 citing papers

representative citing papers

cond-mat.mes-hall · 2026-07-23 · conditional · novelty 6.0

STM/STS resolves two defect types in CrSBr; DFT-simulated images identify the type-2 defect as a b-axis-aligned double sulfur vacancy.

Showing 1 of 1 citing paper.

Visualization of Defect Electronic States in Layered Semiconductor CrSBr cond-mat.mes-hall · 2026-07-23 · conditional · none · ref 54
STM/STS resolves two defect types in CrSBr; DFT-simulated images identify the type-2 defect as a b-axis-aligned double sulfur vacancy.