A mitigation technique for NBTI aging in multipliers that uses selective 2s complement input transformations to redistribute stress, shown to improve lifetime in systolic arrays with negligible overhead.
On the Understanding of pMOS NBTI Degradation in Advance Nodes: Characterization, Modeling, and Exploration on the Physical Origin of Defects,
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
fields
cs.AR 1years
2026 1verdicts
UNVERDICTED 1representative citing papers
citing papers explorer
-
Building Reliable Arithmetic Multipliers Under NBTI Aging and Process Variations
A mitigation technique for NBTI aging in multipliers that uses selective 2s complement input transformations to redistribute stress, shown to improve lifetime in systolic arrays with negligible overhead.