Ultrafast wide-field interferometric microscope extends effective depth of field to 18 μm at NA 0.9 for single-shot 3D topography with 235 nm spatial and 170 fs temporal resolution.
Super-resolution three-dimensional structured illumination profilometry for in situ measurement of femtosecond laser ablation morphology,
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Ultrafast wide-field 3D topography with extended depth of field
Ultrafast wide-field interferometric microscope extends effective depth of field to 18 μm at NA 0.9 for single-shot 3D topography with 235 nm spatial and 170 fs temporal resolution.