A Mach-Zehnder based rotational shear shearography system with virtual double slit is introduced for flexible sensitivity control and defect detection in rotationally symmetric components.
Spatial-carrier fringe-pattern analysis and its applications to precision interferometry and profilometry: An overview,
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2026 1verdicts
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Mach-Zehnder based Rotational Shearing Interferometer for Non-destructive Testing using Spatial Phase-Shifting Shearography
A Mach-Zehnder based rotational shear shearography system with virtual double slit is introduced for flexible sensitivity control and defect detection in rotationally symmetric components.