A Bayesian MCTS planner that adapts stress decisions online improves simulated semiconductor reliability characterization yield from 20% to 54% under competing BTI, EM, and TDDB failure mechanisms.
Reli- ability studies of a 10nm high-performance and low-power CMOS tech- nology featuring 3rd generation FinFET and 5th generation HK/MG,
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Adaptive Sequential Test Planning for Multi-Mechanism Reliability Qualification via Bayesian Monte Carlo Tree Search
A Bayesian MCTS planner that adapts stress decisions online improves simulated semiconductor reliability characterization yield from 20% to 54% under competing BTI, EM, and TDDB failure mechanisms.