Fits of a contact-interaction parameter to LEP Bhabha data yield deviations above 3σ in several models, but the overall fits are poor and only statistical uncertainties are considered.
Eichten, Kenneth D
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New test on contact interactions in the data at $\sqrt{s}$ 130-207GeV by Bhabha scattering process $e^+e^-\to e^+e^-$
Fits of a contact-interaction parameter to LEP Bhabha data yield deviations above 3σ in several models, but the overall fits are poor and only statistical uncertainties are considered.