A diffusion-model prior combined with diffusion posterior sampling improves simulated multislice electron ptychography reconstruction, with SSIM gains of about 90 percent over standard solvers.
Diffusion pos- terior sampling for general noisy inverse problems
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Improving Multislice Electron Ptychography with a Generative Prior
A diffusion-model prior combined with diffusion posterior sampling improves simulated multislice electron ptychography reconstruction, with SSIM gains of about 90 percent over standard solvers.