Intercalating bilayer indium between graphene and SiC enhances dielectric screening to a claimed effective substrate constant around 600, an order of magnitude above prior intercalants, though the exact value is undermined by internal inconsistencies.
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Enhanced Screening in Epitaxial Graphene via Nearly Free-Electron Metal Intercalation
Intercalating bilayer indium between graphene and SiC enhances dielectric screening to a claimed effective substrate constant around 600, an order of magnitude above prior intercalants, though the exact value is undermined by internal inconsistencies.