Test escapes causing silent data corruption occur at roughly 5,000 parts per million, at least 10 times above industrial targets, across compute chips in large data centers.
Shawn Blanton of CMU and Prof
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Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing
Test escapes causing silent data corruption occur at roughly 5,000 parts per million, at least 10 times above industrial targets, across compute chips in large data centers.