A 610-day aging test of a scientific CMOS X-ray detector shows no significant degradation in key performance parameters, with a projected gain loss of 2.4% over ten years.
Ling, et al., A correlogram method to examine the crosstalk of sCMOS sensors, Journal of Instrumentation 16 (3) (2021) P03018
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Long-term stability of scientific X-ray CMOS detectors
A 610-day aging test of a scientific CMOS X-ray detector shows no significant degradation in key performance parameters, with a projected gain loss of 2.4% over ten years.