A modular automated probe card system enables flexible I-V and C-V characterization of 16x16 LGAD arrays with low added leakage and scan times of 20-340 minutes.
Characterization of the first full-size production for ePIC TOF layers.PoS, VERTEX2025:020, 2025
1 Pith paper cite this work. Polarity classification is still indexing.
1
Pith paper citing it
fields
physics.ins-det 1years
2026 1verdicts
UNVERDICTED 1representative citing papers
citing papers explorer
-
Development of a system for testing full-size CMS LGAD sensors
A modular automated probe card system enables flexible I-V and C-V characterization of 16x16 LGAD arrays with low added leakage and scan times of 20-340 minutes.