A modified RT-DETR architecture with two new feature modules achieves mAP 0.956 on a new 800-image bare PCB dataset, at 17M parameters and 48.2G FLOPs.
Improved normalized cross-correlation for defect detection in printed-circuit boards,
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MRC-DETR: An Adaptive Multi-Residual Coupled Transformer for Bare Board PCB Defect Detection
A modified RT-DETR architecture with two new feature modules achieves mAP 0.956 on a new 800-image bare PCB dataset, at 17M parameters and 48.2G FLOPs.