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Cepstrum-based interferometric microscopy (CIM) for quantitative phase imaging
ref [25] · 2501.10022 · notice #9505 · dispute
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Y. Baek, K. Lee, J. Yoon, K. Kim, Y. Park, K. Lee, K. Kim, J. Jung, J. Heo, S. Cho, S. Lee, G. Chang, Y. Jo, H. Park, Y. Park, C.A. Best, K. Badizadegan, R.R. Dasari, M.S. Feld, T. Kuriabova, M.L. Henle, A.J. Levine, G. Popescu, P. Jourdain, N. Pavillon, C. Moratal, D. Boss, B. Rappaz, C. Depeursinge, P. Marquet, P.J. Magistretti, White-light quantitative phase imaging unit, Optics Express, Vol. 24, Issue 9, Pp. 9308-9315. 24 (2016) 9308–9315. https://doi.org/10.1364/OE.24.009308