Recoverable Identifier
advisory
doi_compliance
recoverable_identifier
DOI in the printed bibliography is fragmented by whitespace or line breaks. A longer candidate (10.1116/6.0004493(May2025) was visible in the surrounding text but could not be confirmed against doi.org as printed.
Paper page Integrity report arXiv Try DOI
Evidence text
Kaspar, T. C.et al.Machine-Learning-Enabled on-the-Fly Analysis of RHEED Patterns during Thin Film Deposition by Molecular Beam Epitaxy.Journal of Vacuum Science & Technology A 43,032702. doi:10.1116/6.0004493(May 2025)
Evidence payload
{
"printed_excerpt": "Kaspar, T. C.et al.Machine-Learning-Enabled on-the-Fly Analysis of RHEED Patterns during Thin Film Deposition by Molecular Beam Epitaxy.Journal of Vacuum Science & Technology A 43,032702. doi:10.1116/6.0004493(May 2025)",
"reconstructed_doi": "10.1116/6.0004493(May2025",
"ref_index": 40,
"resolved_title": null,
"verdict_class": "incontrovertible"
}