Citation notice #10143 · 2026-08-14 18:18:46.083003+00:00
Low temperature growth and optical properties of {\alpha}-Ga2O3 deposited on sapphire by plasma enhanced atomic layer deposition
Correction
Crossref
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cites 10.1063/1.4985855, which carries a correction notice dated 2018-10-03. One-hop deterministic notice: the citation edge exists in the Pith bibliography graph; no model judged whether the citation was load-bearing.
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01Evidence
Raw extraction · bibliography line · bibliography index 1
Ghose, S. et al. Growth and characterization of β-Ga2O3thin films by molecular beam epitaxy for deep- UV photodetectors. J. Appl. Phys. (2017). doi:10.1063/1.4985855
02Event
- Type
- Correction
- Source
- Crossref
- Original DOI
- 10.1063/1.4985855
- Notice DOI
- 10.1063/1.5051998
- Date
- 2018-10-03
- Title
- Erratum: “Growth and characterization of β-Ga2O3 thin films by molecular beam epitaxy for deep-UV photodetectors” [J. Appl. Phys. 122, 095302 (2017)]
- Reasons
- ['Correction']
- Work
- - (2017)
03Dispute this notice
If this citation does not depend on the flagged claim, or the event is wrong, say so. Disputes are public. For a signed challenge against the paper itself, use the formal challenge form.