pith. machine review for the scientific record. sign in

arxiv: 0712.1112 · v2 · submitted 2007-12-07 · ✦ hep-ex

Recognition: unknown

Measurement of the charged kaon lifetime with the KLOE detector

Authors on Pith no claims yet
classification ✦ hep-ex
keywords chargeddecaykaonlifetimedistributionstaggedchargesdecays
0
0 comments X
read the original abstract

We have measured the charged kaon lifetime using a sample of 15 \times 10^6 tagged kaon decays. Charged kaons were produced in pairs at the DA\PhiNE \phi-factory, e^+e^- \to \phi \to K^+ K^-. The decay of a K^+ was tagged by the production of a K^- and viceversa. The lifetime was obtained, for both charges, from independent measurements of the decay time and decay lenght distributions. From fits to the four distributions we find \tau = (12.347\pm0.030) ns.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.