New type of ellipsometry in infrared spectroscopy: The double-reference method
classification
⚛️ physics.optics
keywords
complexellipsometryindexreferencerefractivetypeallowsanother
read the original abstract
We have developed a conceptually new type of ellipsometry which allows the determination of the complex refractive index by simultaneously measuring the unpolarized normal-incidence reflectivity relative to the vacuum and to another reference media. From these two quantities the complex optical response can be directly obtained without Kramers-Kronig transformation. Due to its transparency and large refractive index over a broad range of the spectrum, from the far-infrared to the soft ultraviolet region, diamond can be ideally used as a second reference. The experimental arrangement is rather simple compared to other ellipsometric techniques.
This paper has not been read by Pith yet.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.