pith. sign in

arxiv: 0906.2063 · v1 · submitted 2009-06-11 · ⚛️ physics.ins-det

Integrated Circuit Readout for the Silicon Sensor Test Station

classification ⚛️ physics.ins-det
keywords sensorssiliconchipscircuitintegratedreadouttestallow
0
0 comments X
read the original abstract

Various chips for the silicon sensors measurements are described. These chips are based on 0.35 um and 0.18um CMOS technology. Several analog chips together with self-trigger /derandomizer one allow to measure silicon sensors designed for different purposes. Tracking systems, calorimeters, particle charge measurement system and other application sensors can be investigated by the integrated circuit readout with laser or radioactive sources. Also electrical parameters of silicon sensors can be studied by such test setup.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.