pith. sign in

arxiv: 1602.02703 · v1 · pith:GC5AXGLInew · submitted 2016-02-08 · ⚛️ physics.optics

Extended formalism for simulating compound refractive lens-based x-ray microscopes

classification ⚛️ physics.optics
keywords imagingformalismx-rayaberrationaccountanalysisanalyticalaperture
0
0 comments X
read the original abstract

We present a comprehensive formalism for the simulation and optimisation of CRLs in both condensing and full-field imaging configurations. The approach extends ray transfer matrix analysis to account for x-ray attenuation by the lens material. Closed analytical expressions for critical imaging parameters such as numerical aperture, vignetting, chromatic aberration and focal length are provided for both thin- and thick-lens imaging geometries.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.