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arxiv: 1611.00151 · v1 · submitted 2016-11-01 · ⚛️ physics.ins-det · physics.acc-ph

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Design and Test of Wire-Scanners for SwissFEL

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classification ⚛️ physics.ins-det physics.acc-ph
keywords swissfelbeamwillwire-scannersdesignelectronprofiletransverse
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The SwissFEL light-facility will provide coherent X-rays in the wavelength region 7-0.7 nm and 0.7-0.1 nm. In SwissFEL, view-screens and wire-scanners will be used to monitor the transverse profile of a 200/10pC electron beam with a normalized emittance of 0.4/0.2 mm.mrad and a final energy of 5.8 GeV. Compared to view screens, wire-scanners offer a quasi-non-destructive monitoring of the beam transverse profile without suffering from possible micro-bunching of the electron beam. The main aspects of the design, laboratory characterization and beam-test of the SwissFEL wire-scanner prototype will be discussed.

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