Near-field speckle-scanning-based X-ray tomography

We previously demonstrated near-field speckle scanning based x-ray imaging to be an easy-to-implement phase sensing method capable of providing both high sensitivity and high resolution. Yet, this performance combination could only be achieved at the cost of a significant number of sample exposures and of extensive data acquisition time, thus tempering its implementation for tomography applications. Herein, we show ways of drastically lowering the number of exposures for the speckle scanning method to become attractive for computed tomography (CT) imaging. As the method presented can cope with a high divergence beam, it is also expected to attract the attention of the laboratory sources community.