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arxiv: 1702.05180 · v1 · pith:J3RTRCB7new · submitted 2017-02-16 · ⚛️ physics.ins-det · hep-ex

Test of UFSD Silicon Detectors for the TOTEM Upgrade Project

classification ⚛️ physics.ins-det hep-ex
keywords biasmeasuredprecisiontimingvoltagebeambeencapacitance
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This paper describes the performance of a prototype timing detector, based on 50 micrometer thick Ultra Fast Silicon Detector, as measured in a beam test using a 180 GeV/c momentum pion beam. The dependence of the time precision on the pixel capacitance and the bias voltage is investigated here. A timing precision from 30 ps to 100 ps, depending on the pixel capacitance, has been measured at a bias voltage of 180 V. Timing precision has also been measured as a function of the bias voltage.

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