Study of external electron injection and trapping in the blow-out regime

In this work we study electron side-injection and trapping in the blow-out regime in deep plasma channels. We analyze the maximum angle of injection, for which at least 90\% of the injected electrons are trapped. We discuss the dependence of this angle on the electrons' initial energy and their injection positions. In the scope of a semi-analytical blow-out model we show that the injection position is a less critical factor for trapping if electrons are injected into deep plasma channels. PIC simulations and analytical approximations support our results from the semi-analytical model.