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arxiv: 1808.10834 · v1 · pith:FTHKXFQOnew · submitted 2018-08-31 · ⚛️ physics.app-ph

3D-Printed Optics for Wafer-Scale Probing

classification ⚛️ physics.app-ph
keywords d-printedallowapplicablecircuitscouplingdemonstratedifferentefficient
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Mass production of photonic integrated circuits requires high-throughput wafer-level testing. We demonstrate that optical probes equipped with 3D-printed elements allow for efficient coupling of light to etched facets of nanophotonic waveguides. The technique is widely applicable to different integration platforms.

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