Pith. sign in

REVIEW

Spectrally resolved linewidth enhancement factor of a semiconductor frequency comb

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2104.05747 v1 pith:25ELDLTA submitted 2021-04-12 physics.optics physics.app-ph

classification physics.opticsphysics.app-ph
keywords combfrequencyenhancementfactorlaserlinewidthresolvedsemiconductor
verification ladder T0 review T1 audit T2 compute T3 formal
0 comments
read the original abstract

The linewidth enhancement factor (LEF) has recently moved into the spotlight of research on frequency comb generation in semiconductor lasers. Here we present a novel modulation experiment, which enables the direct measurement of the spectrally resolved LEF in a laser frequency comb. By utilizing a phase-sensitive technique, we are able to extract the LEF for each comb mode. We first investigate and verify this universally applicable technique using Maxwell-Bloch simulations and then present the experimental demonstration on a quantum cascade laser frequency comb.

Discussion (0). Sign in to comment.

Pith tools