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arxiv: 2210.13244 · v1 · pith:3E7D3WIGnew · submitted 2022-10-20 · ⚛️ physics.ins-det · hep-ex

Understanding the direct detection of charged particles with SiPMs

F. Carnesecchi , G. Vignola , N. Agrawal , A. Alici , P. Antonioli , S. Arcelli , F. Bellini , D. Cavazza
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L. Cifarelli M. Colocci S. Durando F. Ercolessi A. Ficorella C. Fraticelli M. Garbini M. Giacalone A. Gola D. Hatzifotiadou N. Jacazio A. Margotti G. Malfattore R. Nania F. Noferini G. Paternoster O. Pinazza R. Preghenella R. Rath R. Ricci L. Rignanese N. Rubini B. Sabiu E. Scapparone G. Scioli S. Strazzi S. Tripathy A. Zichichi
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classification ⚛️ physics.ins-det hep-ex
keywords chargedparticlesprotectionresponsesensorsbeencherenkovdetection
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In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.

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