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X-Ray Scattering at Lanthanide M5 Resonances: Application to Magnetic Depth Profiling

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arxiv cond-mat/0509725 v1 pith:DVOBDLKP submitted 2005-09-28 cond-mat.other

H. Ott , C. Schuessler-Langeheine , E. Schierle , A. Yu. Grigoriev , V. Leiner , H. Zabel , G. Kaindl , E. Weschke This is my paper · ORCID
classification cond-mat.other
keywords magneticdepthscatteringx-raymetalresonancesacrossallows
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Quantitative analyses of x-ray scattering from thin films of Ho and Dy metal at the M_5 resonances result in values of the optical constants and the magnetic scattering lengths f_m, with f_m as large as 200 r_0. The observation of first- and second-order magnetic satellites allows to separate f_m into circular and linear dichroic contributions. This high magnetic sensitivity, in conjunction with the tunable x-ray probing depth across the resonance can be applied to monitor depth profiles of complex magnetic structures, as e.g. of helical antiferromagnetic domains in a Dy metal film.

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