Pith. sign in

REVIEW

Variation in interface strength of Silicon with surface engineered Ti3C2 MXenes

Not yet reviewed by Pith; the record is open.

This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.

SPECIMEN: schema-true, not a live event

T0 review · schema-true

One-sentence machine reading of the paper's core claim.

pith:XXXXXXXX · record.json · timestamp

arxiv 2009.12712 v2 pith:6DIXCNUM submitted 2020-09-27 physics.app-ph

classification physics.app-ph
keywords interfacesurfacestrengthmxenefunctionalgroupsti3c2amorphous
verification ladder T0 review T1 audit T2 compute T3 formal
0 comments
read the original abstract

Current advancements in battery technologies require electrodes to combine high-performance active material such as Silicon (Si) with two-dimensional materials such as transition metal carbides (MXenes) for prolonged cycle stability and enhanced electrochemical performance. More so, it is the interface between these materials, which is the nexus for their applicatory success. Herein, the interface strength variations between amorphous Si and Ti3C2Tx MXene are determined as the MXene surface functional groups (Tx) are changed using first principle calculations. Si is interfaced with three Ti3C2 MXene substrates having surface -OH, -OH and -O mixed, and -F functional groups. Density functional theory (DFT) results reveal that completely hydroxylated Ti3C2 has the highest interface strength of 0.6 J/m2 with amorphous Si. This interface strength value drops as the proportion of surface -O and -F groups increases. Additional analysis of electron redistribution and charge separation across the interface is provided for a complete understanding of underlying physico-chemical factors affecting the surface chemistry and resultant interface strength values. The presented comprehensive analysis of the interface aims to develop sophisticated MXene based electrodes by their targeted surface engineering.

Discussion (0). Sign in to comment.

Pith tools