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Paper Citation Record · LEDGER

Impact of the disk thickness on X-ray reflection spectroscopy measurements

As of 7 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2102.04695.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2102.04695 v2

Coverage vector

measured 0 of 0 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links

measured 1 of 1 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-06T06:34:29.942622+00:00

measured 1 of 1 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-08-02T22:32:36.737804Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

0 of 0 outbound references displayed

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  • malformed identifier0
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External citation measurements

No source-named external measurement is stored.

Outbound references

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Pith citing papers

Observation 8d64b4b2-4b9c-4f3f-9688-046f5caa0f27 · inbound

Testing non-circular black hole spacetime with X-ray reflection cites this paper.

Testing non-circular black hole spacetime with X-ray reflection Impact of the disk thickness on X-ray reflection spectroscopy measurements

Reference 61

Resolution
unresolved
no resolver link, observed 2026-08-02T22:32:36.737804Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-02T22:32:36.737804Z digest=sha256:e105f3b169a1c6d658ad0f47ece9c90a15709b5ef40a1be75b0ec44e8e894f91