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Paper Integrity Record · LEDGER

Influences of ALD Al₂O₃ on the surface band-bending of c-plane, Ga-face GaN and the implication to GaN-collector npn heterojunction bipolar transistors

As of an unrecorded date, Pith completed 0 of 0 listed checks against arXiv:2109.04597. No listed check completed, so this record makes no findings claim.

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pith.integrity.v1
2109.04597 v1
pith:2021:NWAG2XQ3OF46VOOEZZH6ILGO3I

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