Typed states for the displayed outbound observations.
Source: paper_references, paper_reference_links
Paper Citation Record · LEDGER
QuFI: a Quantum Fault Injector to Measure the Reliability of Qubits and Quantum Circuits
As of 17 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 1 inbound Pith citation observation for arXiv:2203.07183.
A citation records a reference. It does not transfer a finding from one paper to another.
Coverage vector
One-hop event checks from named stored sources.
Source: scholarly_work_events, retraction_status_cache, observed 2026-08-16T06:30:59.297886+00:00
Pith citing papers itemized under the disclosed page cap.
Source: paper_references, paper_reference_links, observed 2026-08-15T19:24:11.931995Z
A source-named dated measurement, never combined with another source.
Source: pith, observed 2026-08-15T19:24:12.374296Z
Reference resolution
0 of 0 outbound references displayed
- verified exact0
- verified fuzzy0
- unresolved0
- parse uncertain0
- malformed identifier0
- metadata mismatch0
External citation measurements
No source-named external measurement is stored.
Outbound references
No outbound reference observations are available for this paper version.
Pith citing papers
Observation f4b79fa3-c954-4adf-9481-acb1cd7c0a0c · inbound
Radiation-Induced Fault Detection in Superconducting Quantum Devices cites this paper.
Radiation-Induced Fault Detection in Superconducting Quantum Devices QuFI: a Quantum Fault Injector to Measure the Reliability of Qubits and Quantum Circuits
Reference 37
- Resolution
- verified exact
- local_arxiv, observed 2026-08-15T19:24:12.379069Z
Source-reported events for the cited work
No event found in the named queried sources as of 2026-08-16T06:30:59.297886+00:00.