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Paper Citation Record · LEDGER

Assessment of error variation in high-fidelity two-qubit gates in silicon

As of 4 August 2026, this Paper Citation Record lists 0 of 0 outbound references and 2 inbound Pith citation observations for arXiv:2303.04090.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2303.04090 v3

Coverage vector

measured 0 of 0 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links

measured 2 of 2 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-04T06:34:03.388597+00:00

measured 2 of 2 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-06-28T14:43:34.367055Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: arxiv_reference, observed 2026-07-10T06:15:00.866473Z

Reference resolution

0 of 0 outbound references displayed

  • verified exact0
  • verified fuzzy0
  • unresolved0
  • parse uncertain0
  • malformed identifier0
  • metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

No outbound reference observations are available for this paper version.

Pith citing papers

Observation d268e22d-fa92-498f-9a36-4729f400c7bc · inbound

CMOS compatibility of semiconductor spin qubits cites this paper.

CMOS compatibility of semiconductor spin qubits Assessment of error variation in high-fidelity two-qubit gates in silicon

Reference 33

Resolution
verified exact
arxiv_id, observed 2026-05-23T21:13:26.475015Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.

source=pdf_text observed=2026-05-23T21:12:52.044490Z digest=sha256:603519f729cc1c5e96f762f52ba73735790b4abf3a921b907e12e58d892903b5

Observation 9c50a953-8efb-46cd-9055-6c4088713684 · inbound

Smooth velocity shuttling for suppressing valley excitations in disordered Si/SiGe quantum dots cites this paper.

Smooth velocity shuttling for suppressing valley excitations in disordered Si/SiGe quantum dots Assessment of error variation in high-fidelity two-qubit gates in silicon

Reference 27

Resolution
verified exact
arxiv_id, observed 2026-07-01T23:06:20.066498Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-04T06:34:03.388597+00:00.

source=pdf_text observed=2026-06-28T14:43:34.367055Z digest=sha256:f4b8be3ec4d1b8f06b58eaed0dd5cfa56ba40f692c5a09909d3f0cbafd6da4e2