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3D Heterogeneous Integration of Silicon Nitride and Aluminum Nitride on Sapphire toward Ultra-wideband Photonics Integrated Circuits

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arxiv 2503.22544 v2 pith:TMETVNO4 submitted 2025-03-28 physics.optics physics.app-ph

classification physics.opticsphysics.app-ph
keywords picsopticalnitrideplatformapplicationsintegratedsiliconaluminum
verification ladder T0 review T1 audit T2 compute T3 formal
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abstract

Extending two-dimensional photonic integrated circuits (PICs) to three-dimensional (3D) configurations promises great potential for scaling up integration, enhancing functionality, and improving performance of PICs. Silicon-based 3D PICs have made substantial progress due to CMOS compatibility. However, the narrow bandgap of silicon (1.1 eV) limits their use in short-wavelength applications, such as chemical and biological sensing, underwater optical communications, and optical atomic clocks. In this work, we developed a 3D photonics platform by heterogeneously integrating silicon nitride (SiN) and aluminum nitride (AlN) PICs on sapphire (Al$_2$O$_3$). The broadband transparency of these materials allow our platform to operate over a multi-octave wavelength ranging from ultraviolet to infrared. Leveraging this platform, we demonstrated efficient optical nonlinearity in an AlN microcavity, low-loss and tunable SiN waveguide-based optical components, and optical linking between AlN and SiN PICs layers in the visible and near-infrared spectrum, hinting at potential applications in integrated quantum systems. Our work presents an ultra-wideband 3D PICs platform, providing new opportunities for broadband and short-wavelength applications of PICs.

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Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

  1. Qualification pathways for Photonic Integrated Circuits in Astrophotonic Space Missions

    astro-ph.IM 2026-08 conditional novelty 5.0 of 10

    A single, tailorable seven-phase qualification template (PIC-SQT) consolidates 19 NASA/ESA/industry test steps for space-bound astrophotonic chips, plus a gap list of unstandardized tests.

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