Paper Citation Record · LEDGER

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices

As of 7 August 2026, this Paper Citation Record lists 52 of 52 outbound references and 0 inbound Pith citation observations for arXiv:2507.19663.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2507.19663 v1

Coverage vector

measured 52 of 52 reference resolution

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One-hop event checks from named stored sources.

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Pith citing papers itemized under the disclosed page cap.

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measured 0 of 1 external citation measurements

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Reference resolution

52 of 52 outbound references displayed

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External citation measurements

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Outbound references

Observation 9bd443ec-6de1-46e8-aa29-3f8269edea64 · outbound

This paper cites an unresolved cited work.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

Reference 1

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Observation d5f8294a-3086-4726-8f0c-d29bf0e2ee47 · outbound

This paper cites Shahriari, K.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Shahriari, K

Reference 2

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Observation f7662caa-7978-48a6-9485-4a2d7244fe2f · outbound

This paper cites Garnett, Bayesian optimization, Cambridge University Press, 2023.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Garnett, Bayesian optimization, Cambridge University Press, 2023

Reference 3

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Observation 2d9c0cdd-d078-4e38-bf6c-c21af143e53d · outbound

This paper cites Zhang, W.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Zhang, W

Reference 4

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Observation 24aa3f5c-af67-4fd6-a511-538b5bee7cf4 · outbound

This paper cites Huang, C.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Huang, C

Reference 5

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This paper cites Zhang, F.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Zhang, F

Reference 6

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Observation 9194b8b4-2b1f-487f-86ba-db62faa0772f · outbound

This paper cites Tilgner, Physics of failure for interconnect structures: an essay, Microsys- tem technologies 15 (1) (2009) 129–138.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Tilgner, Physics of failure for interconnect structures: an essay, Microsys- tem technologies 15 (1) (2009) 129–138

Reference 7

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This paper cites an unresolved cited work.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

Reference 8

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Observation c3a46e5d-7cbc-4941-a719-c42add7d2e01 · outbound

This paper cites Musadiq, W.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Musadiq, W

Reference 9

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Observation 2a0af54f-d57a-41f1-a4ea-8bc44cccdd5a · outbound

This paper cites Pecht, Handbook of electronic package design, CRC press, 2018.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Pecht, Handbook of electronic package design, CRC press, 2018

Reference 10

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Observation 1d6d76e5-0e4d-4e02-9a12-590f2c713644 · outbound

This paper cites Wolfgang, Examples for failures in power electronics systems, ECPE tu- torial on reliability of power electronic systems, Nuremberg, Germany (2007) 19–20.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Wolfgang, Examples for failures in power electronics systems, ECPE tu- torial on reliability of power electronic systems, Nuremberg, Germany (2007) 19–20

Reference 11

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Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

Reference 12

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This paper cites Arabi, A.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Arabi, A

Reference 13

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Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

Reference 14

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Observation ebe9fdda-dafa-4d5f-b53f-5af2a49d237f · outbound

This paper cites De Jong, A.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices De Jong, A

Reference 15

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Observation 4e55bcd9-a995-4113-805e-897bacbebf19 · outbound

This paper cites de Jong, A.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices de Jong, A

Reference 16

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Observation f9cd298b-190d-4c9c-bf8e-453a3c1432fc · outbound

This paper cites Van Driel, G.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Van Driel, G

Reference 17

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This paper cites Wymys lowski, W.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Wymys lowski, W

Reference 18

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This paper cites A Tutorial on Bayesian Optimization.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices A Tutorial on Bayesian Optimization

Reference 19

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This paper cites Feurer, J.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Feurer, J

Reference 20

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Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

Reference 21

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Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

Reference 22

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This paper cites Khalil, A.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Khalil, A

Reference 23

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Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Sharma, T

Reference 24

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This paper cites an unresolved cited work.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

Reference 26

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Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

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This paper cites Auer, Using confidence bounds for exploitation-exploration trade-offs, Jour- nal of Machine Learning Research 3 (Nov) (2002) 397–422.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Auer, Using confidence bounds for exploitation-exploration trade-offs, Jour- nal of Machine Learning Research 3 (Nov) (2002) 397–422

Reference 28

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This paper cites Adam: A Method for Stochastic Optimization.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Adam: A Method for Stochastic Optimization

Reference 29

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This paper cites Unexpected Improvements to Expected Improvement for Bayesian Optimization.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unexpected Improvements to Expected Improvement for Bayesian Optimization

Reference 31

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This paper cites Duvenaud, J.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Duvenaud, J

Reference 32

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Observation 4cda675a-7f1e-4641-b349-93bc512d49af · outbound

This paper cites Chicco, M.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Chicco, M

Reference 33

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This paper cites Are you using test log-likelihood correctly?.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Are you using test log-likelihood correctly?

Reference 34

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Observation 67780aab-103a-4b18-a4b6-3c8e1ef35edc · outbound

This paper cites Gelman, J.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Gelman, J

Reference 35

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Observation b2c691ba-64f0-44b3-a8af-6d87f600950a · outbound

This paper cites Tree-Structured Parzen Estimator: Understanding Its Algorithm Components and Their Roles for Better Empirical Performance.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Tree-Structured Parzen Estimator: Understanding Its Algorithm Components and Their Roles for Better Empirical Performance

Reference 36

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Observation 445574af-81b9-41f1-a54f-8234d308f1a6 · outbound

This paper cites Hutter, H.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Hutter, H

Reference 37

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Observation da7fda7a-71bb-48f2-8887-0b5ba5365856 · outbound

This paper cites Bergstra, B.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Bergstra, B

Reference 38

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Observation 5bb4ef2f-09aa-4c4a-bdc5-edf677ffd8e8 · outbound

This paper cites Akiba, S.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Akiba, S

Reference 39

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Observation d4b1d99c-d02f-43ff-b76a-d36f49ce5c3e · outbound

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Reference 40

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Observation 8d8a9ccb-321c-4b78-8e01-b994989484ee · outbound

This paper cites Tuning Hyperparameters without Grad Students: Scalable and Robust Bayesian Optimisation with Dragonfly.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Tuning Hyperparameters without Grad Students: Scalable and Robust Bayesian Optimisation with Dragonfly

Reference 41

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Observation 7adfe4fd-ca6b-40a1-a990-1c78784081be · outbound

This paper cites an unresolved cited work.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

Reference 42

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Observation d854cb37-a3f6-4c52-bafc-1ca4fe803947 · outbound

This paper cites an unresolved cited work.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

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Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

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Observation 02449761-e57a-43be-9ccd-8dc2d41ae82d · outbound

This paper cites Saltelli, P.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Saltelli, P

Reference 45

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T14:15:43.391262Z

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Observation 711a7446-289b-417b-bf1e-47c43c505b41 · outbound

This paper cites Niessner, A.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Niessner, A

Reference 46

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T14:15:43.382984Z

Source-reported events for the cited work

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Observation ad872792-58c7-436d-a7fd-e6c714877334 · outbound

This paper cites Gromala, A.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Gromala, A

Reference 47

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T14:15:43.374208Z

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Observation 270585ba-c22f-4e33-a47c-c669d2ffc911 · outbound

This paper cites Nossent, P.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Nossent, P

Reference 48

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T14:15:43.366212Z

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Observation c452236f-c2cf-4217-aa4b-6f8b498276e3 · outbound

This paper cites Zhang, M.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Zhang, M

Reference 49

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T14:15:43.358504Z

Source-reported events for the cited work

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Observation 4f526979-5bc0-4075-9edf-24e5867505b1 · outbound

This paper cites an unresolved cited work.

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Observation 93b57c4d-bf63-487d-875a-2ec6c95f2da1 · outbound

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Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Unresolved cited work

Reference 51

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Source-reported events for the cited work

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Observation db0e9304-c9bf-45f7-953f-40ea03f03272 · outbound

This paper cites Vandevelde, E.

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices Vandevelde, E

Reference 52

Resolution: verified fuzzy; raw_fallback, observed 2026-08-06T14:15:43.333402Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-07T06:34:17.273281+00:00.

Pith citing papers

No inbound Pith citation observations are available.